Deep learning in optical metrology: a review
With the advances in scientific foundations and technological implementations, optical metrology has become versatile problem-solving backbones in manufacturing, fundamental research, and engineering applications, such as quality control, nondestructive testing, experimental mechanics, and biomedici...
Saved in:
Main Authors: | Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian |
---|---|
Other Authors: | School of Computer Science and Engineering |
Format: | Article |
Language: | English |
Published: |
2022
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/160720 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Flattening-net: deep regular 2D representation for 3D point cloud analysis
by: Zhang, Qijian, et al.
Published: (2023) -
Stealthy and robust backdoor attack on deep neural networks based on data augmentation
by: Xu, Chaohui, et al.
Published: (2024) -
Diffense: defense against backdoor attacks on deep neural networks with latent diffusion
by: Hu, Bowen, et al.
Published: (2025) -
Deep learning for real-world object detection
by: WU, Xiongwei
Published: (2020) -
A deep branching solver for fully nonlinear partial differential equations
by: Nguwi, Jiang Yu, et al.
Published: (2024)