Deep learning in optical metrology: a review

• المؤلفون الرئيسيون: Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian
• مؤلفون آخرون: School of Computer Science and Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2022
• الموضوعات: Engineering::Computer science and engineering; Deep Neural Networks; Digital Storage
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/160720
• المؤسسة: Nanyang Technological University

With the advances in scientific foundations and technological implementations, optical metrology has become versatile problem-solving backbones in manufacturing, fundamental research, and engineering applications, such as quality control, nondestructive testing, experimental mechanics, and biomedici...