Deep learning in optical metrology: a review

With the advances in scientific foundations and technological implementations, optical metrology has become versatile problem-solving backbones in manufacturing, fundamental research, and engineering applications, such as quality control, nondestructive testing, experimental mechanics, and biomedici...

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Main Authors: Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian
其他作者: School of Computer Science and Engineering
格式: Article
語言:English
出版: 2022
主題:
在線閱讀:https://hdl.handle.net/10356/160720
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機構: Nanyang Technological University
語言: English