Optical characterization of grain orientation in crystalline materials

Characterizing crystallographic orientation is essential for assessing structure-property relationships in crystalline solids. While diffraction methods have dominated this field, low throughput and high cost limit their applicability to small, specialized samples and restrict access to well-funded...

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Main Authors: Gaskey, Bernard, Hendl, Ludwig, Wang, Xiaogang, Seita, Matteo
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2022
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Online Access:https://hdl.handle.net/10356/160889
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1608892022-08-05T05:12:11Z Optical characterization of grain orientation in crystalline materials Gaskey, Bernard Hendl, Ludwig Wang, Xiaogang Seita, Matteo School of Mechanical and Aerospace Engineering School of Materials Science and Engineering Engineering::Mechanical engineering Directional Reflectance Crystal Orientation Mapping Characterizing crystallographic orientation is essential for assessing structure-property relationships in crystalline solids. While diffraction methods have dominated this field, low throughput and high cost limit their applicability to small, specialized samples and restrict access to well-funded research institutions. We develop a complementary method that expands applicability and broadens access. We demonstrate crystal orientation mapping over centimeter-scale surfaces using nothing more than a conventional optical microscope and commercial laptop. Our approach relies on a novel analysis method that correlates crystal lattice orientation to optical reflectance of specially etched surfaces. We successfully apply the method to metal and semiconductor surfaces. The simplicity, low cost, and enhanced sample throughput of our method promise to expand the availability of crystallographic orientation mapping significantly, making it readily available in education as well as academic research and industrial settings. Ministry of Education (MOE) Published version This research was funded by the Ministry of Education of Singapore, Official Number: MOE2017-T2-2-119. 2022-08-05T05:12:11Z 2022-08-05T05:12:11Z 2020 Journal Article Gaskey, B., Hendl, L., Wang, X. & Seita, M. (2020). Optical characterization of grain orientation in crystalline materials. Acta Materialia, 194, 558-564. https://dx.doi.org/10.1016/j.actamat.2020.05.027 1359-6454 https://hdl.handle.net/10356/160889 10.1016/j.actamat.2020.05.027 2-s2.0-85086002064 194 558 564 en MOE2017-T2-2-119 Acta Materialia © 2020 The Authors. Published by Elsevier Ltd on behalf of Acta Materialia Inc. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Mechanical engineering
Directional Reflectance
Crystal Orientation Mapping
spellingShingle Engineering::Mechanical engineering
Directional Reflectance
Crystal Orientation Mapping
Gaskey, Bernard
Hendl, Ludwig
Wang, Xiaogang
Seita, Matteo
Optical characterization of grain orientation in crystalline materials
description Characterizing crystallographic orientation is essential for assessing structure-property relationships in crystalline solids. While diffraction methods have dominated this field, low throughput and high cost limit their applicability to small, specialized samples and restrict access to well-funded research institutions. We develop a complementary method that expands applicability and broadens access. We demonstrate crystal orientation mapping over centimeter-scale surfaces using nothing more than a conventional optical microscope and commercial laptop. Our approach relies on a novel analysis method that correlates crystal lattice orientation to optical reflectance of specially etched surfaces. We successfully apply the method to metal and semiconductor surfaces. The simplicity, low cost, and enhanced sample throughput of our method promise to expand the availability of crystallographic orientation mapping significantly, making it readily available in education as well as academic research and industrial settings.
author2 School of Mechanical and Aerospace Engineering
author_facet School of Mechanical and Aerospace Engineering
Gaskey, Bernard
Hendl, Ludwig
Wang, Xiaogang
Seita, Matteo
format Article
author Gaskey, Bernard
Hendl, Ludwig
Wang, Xiaogang
Seita, Matteo
author_sort Gaskey, Bernard
title Optical characterization of grain orientation in crystalline materials
title_short Optical characterization of grain orientation in crystalline materials
title_full Optical characterization of grain orientation in crystalline materials
title_fullStr Optical characterization of grain orientation in crystalline materials
title_full_unstemmed Optical characterization of grain orientation in crystalline materials
title_sort optical characterization of grain orientation in crystalline materials
publishDate 2022
url https://hdl.handle.net/10356/160889
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