Investigation of device-level vulnerabilities in advanced embedded systems

• Main Author: How, Yu Sing
• Other Authors: Gwee Bah Hwee
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2022
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/163504
• Institution: Nanyang Technological University

With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject fau...