Investigation of device-level vulnerabilities in advanced embedded systems

With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject fau...

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Main Author: How, Yu Sing
Other Authors: Gwee Bah Hwee
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2022
Subjects:
Online Access:https://hdl.handle.net/10356/163504
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1635042023-07-07T18:57:00Z Investigation of device-level vulnerabilities in advanced embedded systems How, Yu Sing Gwee Bah Hwee School of Electrical and Electronic Engineering National Integrated Centre for Evaluation ebhgwee@ntu.edu.sg Engineering::Electrical and electronic engineering With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject faults into the embedded devices, which allows the attacker to precisely set the necessary parameters such as the location and timing on the chip that is being attacked. This project aims to propose an approach to integrate and introduce new devices to the platform for the laser fault injection attack. On top of that, previous work has proved that the implementation of the attack on the Atmel AT-mega328P board was successful, and therefore, would like to try and replicate the same attack with a different laser system. Through this project, new vulnerabilities might be identified, which would increase the security of embedded devices. Bachelor of Engineering (Electrical and Electronic Engineering) 2022-12-08T03:01:39Z 2022-12-08T03:01:39Z 2022 Final Year Project (FYP) How, Y. S. (2022). Investigation of device-level vulnerabilities in advanced embedded systems. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/163504 https://hdl.handle.net/10356/163504 en A2371-212 application/pdf Nanyang Technological University
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Electrical and electronic engineering
spellingShingle Engineering::Electrical and electronic engineering
How, Yu Sing
Investigation of device-level vulnerabilities in advanced embedded systems
description With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject faults into the embedded devices, which allows the attacker to precisely set the necessary parameters such as the location and timing on the chip that is being attacked. This project aims to propose an approach to integrate and introduce new devices to the platform for the laser fault injection attack. On top of that, previous work has proved that the implementation of the attack on the Atmel AT-mega328P board was successful, and therefore, would like to try and replicate the same attack with a different laser system. Through this project, new vulnerabilities might be identified, which would increase the security of embedded devices.
author2 Gwee Bah Hwee
author_facet Gwee Bah Hwee
How, Yu Sing
format Final Year Project
author How, Yu Sing
author_sort How, Yu Sing
title Investigation of device-level vulnerabilities in advanced embedded systems
title_short Investigation of device-level vulnerabilities in advanced embedded systems
title_full Investigation of device-level vulnerabilities in advanced embedded systems
title_fullStr Investigation of device-level vulnerabilities in advanced embedded systems
title_full_unstemmed Investigation of device-level vulnerabilities in advanced embedded systems
title_sort investigation of device-level vulnerabilities in advanced embedded systems
publisher Nanyang Technological University
publishDate 2022
url https://hdl.handle.net/10356/163504
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