Investigation of device-level vulnerabilities in advanced embedded systems
With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject fau...
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Final Year Project |
Language: | English |
Published: |
Nanyang Technological University
2022
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/163504 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-163504 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-1635042023-07-07T18:57:00Z Investigation of device-level vulnerabilities in advanced embedded systems How, Yu Sing Gwee Bah Hwee School of Electrical and Electronic Engineering National Integrated Centre for Evaluation ebhgwee@ntu.edu.sg Engineering::Electrical and electronic engineering With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject faults into the embedded devices, which allows the attacker to precisely set the necessary parameters such as the location and timing on the chip that is being attacked. This project aims to propose an approach to integrate and introduce new devices to the platform for the laser fault injection attack. On top of that, previous work has proved that the implementation of the attack on the Atmel AT-mega328P board was successful, and therefore, would like to try and replicate the same attack with a different laser system. Through this project, new vulnerabilities might be identified, which would increase the security of embedded devices. Bachelor of Engineering (Electrical and Electronic Engineering) 2022-12-08T03:01:39Z 2022-12-08T03:01:39Z 2022 Final Year Project (FYP) How, Y. S. (2022). Investigation of device-level vulnerabilities in advanced embedded systems. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/163504 https://hdl.handle.net/10356/163504 en A2371-212 application/pdf Nanyang Technological University |
institution |
Nanyang Technological University |
building |
NTU Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NTU Library |
collection |
DR-NTU |
language |
English |
topic |
Engineering::Electrical and electronic engineering |
spellingShingle |
Engineering::Electrical and electronic engineering How, Yu Sing Investigation of device-level vulnerabilities in advanced embedded systems |
description |
With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject faults into the embedded devices, which allows the attacker to precisely set the necessary
parameters such as the location and timing on the chip that is being attacked. This project aims to propose an approach to integrate and introduce new devices to the platform for the laser fault injection attack. On top of that, previous work has proved that the implementation of the attack on the Atmel AT-mega328P board was successful, and therefore, would like to try and replicate the
same attack with a different laser system. Through this project, new vulnerabilities might be identified, which would increase the security of embedded devices. |
author2 |
Gwee Bah Hwee |
author_facet |
Gwee Bah Hwee How, Yu Sing |
format |
Final Year Project |
author |
How, Yu Sing |
author_sort |
How, Yu Sing |
title |
Investigation of device-level vulnerabilities in advanced embedded systems |
title_short |
Investigation of device-level vulnerabilities in advanced embedded systems |
title_full |
Investigation of device-level vulnerabilities in advanced embedded systems |
title_fullStr |
Investigation of device-level vulnerabilities in advanced embedded systems |
title_full_unstemmed |
Investigation of device-level vulnerabilities in advanced embedded systems |
title_sort |
investigation of device-level vulnerabilities in advanced embedded systems |
publisher |
Nanyang Technological University |
publishDate |
2022 |
url |
https://hdl.handle.net/10356/163504 |
_version_ |
1772827692407717888 |