Dynamic damage analysis of thin film stacked structures for microelectronic devices

In the context of the megatrends of remote working, the development of artificial intelligence, and electric vehicle applications, there is a great demand for better-performing and multi-functional integrated circuit (IC) chips to fill the technology gaps. Moreover, the demand for package minimizati...

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Bibliographic Details
Main Author: Zhao, Facheng
Other Authors: Zhou Kun
Format: Thesis-Doctor of Philosophy
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/164832
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Institution: Nanyang Technological University
Language: English
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