Analog smart I/O pads

• Main Author: Tan, Shyue Mei.
• Other Authors: Chan Pak Kwong
• Format: Final Year Project
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• Online Access: http://hdl.handle.net/10356/16924
• Institution: Nanyang Technological University

Electrostatic discharge (ESD) is one of the leading causes of microchip failure during manufacture as well as field and consumer use [National Semiconductor Corporation]. ESD is an increasingly significant problem in integrated circuit design as increasing pin counts and faster circuit speeds compou...