Doubling of the superconducting transition temperature in ultra-clean wafer-scale aluminum nanofilms

Doubling of the superconducting transition temperature in ultra-clean wafer-scale aluminum nanofilms

We studied the role of reduced dimensionality and disorder in the superconducting properties of wafer-scale aluminum (Al) nanofilms. This new generation of ultrathin films were grown using molecular beam epitaxy and depict normal-state sheet resistance at least 20 times lower than the quantum resist...

Full description

Saved in:
Bibliographic Details
Main Authors: Yeh, Ching-Chen, Do, Thi-Hien, Liao, Pin-Chi, Hsu, Chia-Hung, Tu, Yi-Hsin, Lin, Hsin, Chang, T.-R., Wang, Siang-Chi, Gao, Yu-Yao, Wu, Yu-Hsun, Wu, Chu-Chun, Lai, Yu An, Martin, Ivar, Lin, Sheng-Di, Panagopoulos, Christos, Liang, Chi-Te
Other Authors: School of Physical and Mathematical Sciences
Format: Article
Language:English
Published: 2024
Subjects:
Physics
Aluminum film
Quantum resistance
Online Access:https://hdl.handle.net/10356/173904
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English

Internet

https://hdl.handle.net/10356/173904

Similar Items