Ultrafast charge transfer and recombination dynamics in monolayer–multilayer WSe2 junctions revealed by time-resolved photoemission electron microscopy

• المؤلفون الرئيسيون: Xu, Ce, Barden, Natalie, Alexeev, Evgeny M., Wang, Xiaoli, Long, Run, Cadore, Alisson R., Paradisanos, Ioannis, Ott, Anna K., Soavi, Giancarlo, Tongay, Sefaattin, Cerullo, Giulio, Ferrari, Andrea C., Prezhdo, Oleg V., Loh, Zhi-Heng
• مؤلفون آخرون: School of Chemistry, Chemical Engineering and Biotechnology
• التنسيق: مقال
• اللغة: English
• منشور في: 2024
• الموضوعات: Chemistry; Transition metal dichalcogenides; Lateral junction
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/174681
• المؤسسة: Nanyang Technological University

The ultrafast carrier dynamics of junctions between two chemically identical, but electronically distinct, transition metal dichalcogenides (TMDs) remains largely unknown. Here, we employ time-resolved photoemission electron microscopy (TR-PEEM) to probe the ultrafast carrier dynamics of a monolayer...