Achieving sub-micron resolution in X-ray computational tomography through fixture design

X-Ray Computational Tomography (XCT) is a form of non-destructive testing used to visualise components’ internal features and generate 2D images or 3D models of these components. XCT is an essential tool in the industry for failure analysis and quality control. The quality of scans can be sign...

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書目詳細資料
主要作者: Sheik Muhammad Uwais Bin Ishaak
其他作者: Upadrasta Ramamurty
格式: Final Year Project
語言:English
出版: Nanyang Technological University 2024
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在線閱讀:https://hdl.handle.net/10356/177764
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機構: Nanyang Technological University
語言: English