Achieving sub-micron resolution in X-ray computational tomography through fixture design

• Main Author: Sheik Muhammad Uwais Bin Ishaak
• Other Authors: Upadrasta Ramamurty
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2024
• Subjects: Engineering; Fixture design
• Online Access: https://hdl.handle.net/10356/177764
• Institution: Nanyang Technological University

X-Ray Computational Tomography (XCT) is a form of non-destructive testing used to visualise components’ internal features and generate 2D images or 3D models of these components. XCT is an essential tool in the industry for failure analysis and quality control. The quality of scans can be significantly improved by modifying and adjusting the X-Ray source characteristics and the detector receiving the X-Ray beams. However, doing so can be very costly and complex due to the different tradeoffs when adjusting these characteristics. Improving the proximity of the sample to the source and ensuring sample straightness can also improve the quality of the scanned image. As such, the fixture holding the sample plays a crucial role in obtaining a higher resolution scanned image. This report provides an overview on the design process of the new fixture and how it improves on the drawbacks on current fixtures. Experimental investigations were conducted to investigate the effectiveness of the new fixture on the scanning process in terms of resolution of the image and the straightness of the sample.