Adaptive machine learning for manufactured IC image analysis

• Main Author: Tee, Yee Yang
• Other Authors: Gwee Bah Hwee
• Format: Thesis-Doctor of Philosophy
• Language: English
• Published: Nanyang Technological University 2024
• Subjects: Computer and Information Science; Engineering; Machine learning; Image analysis; Hardware assurance; Image synthesis; Domain adaptation; Adversarial learning
• Online Access: https://hdl.handle.net/10356/181526
• Institution: Nanyang Technological University

The hardware assurance of integrated circuits (ICs), which is concerned with ensuring the security and integrity of ICs, is of paramount importance today given the ubiquity and necessity of semiconductor devices worldwide. Circuit extraction via the analysis of integrated circuit (IC) images is one...