Regularization of deep neural network using a multisample memory model

• Main Authors: Tanveer, Muhammad, Siyal, Mohammad Yakoob, Rashid, Sheikh Faisal
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2025
• Subjects: Engineering; Deeper architecture; Overfitting
• Online Access: https://hdl.handle.net/10356/182482
• Institution: Nanyang Technological University

Deep convolutional neural networks (CNNs) are widely used in computer vision and have achieved significant performance for image classification tasks. Overfitting is a general problem in deep learning models that inhibit the generalization capability of deep models due to the presence of noise, the...