Quadri-wave lateral shearing interferometry: a versatile tool for quantitative phase imaging

Quadri-wave lateral shearing interferometry: a versatile tool for quantitative phase imaging

Quantitative phase imaging (QPI) has emerged as a powerful tool in label-free bioimaging, in situ microstructure characterization for advanced manufacturing, and high-speed imaging of material property changes. Among various QPI methods, quadri-wave lateral shearing interferometry (QWLSI) stands out...

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Bibliographic Details
Main Authors: Xie, Jun, Xie, Hui, Kong, Cheng Zhen, Ling, Tong
Other Authors: School of Chemistry, Chemical Engineering and Biotechnology
Format: Article
Language:English
Published: 2025
Subjects:
Engineering
Lateral shearing interferometry
Quantitative phase imaging
Online Access:https://hdl.handle.net/10356/182760
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Institution: Nanyang Technological University
Language: English

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https://hdl.handle.net/10356/182760

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