Oxygen-based microwave induced plasma etching for epoxy molding compound removal in advanced semiconductor devices
Heterogenous integration has led to the development of advanced semiconductor packages with better performance and smaller form factor. Such packages usually comprise of multiple dies and embedded components which are encapsulated with epoxy molding compounds (EMCs) to improve the reliability perfor...
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Main Authors: | , , , , , |
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其他作者: | |
格式: | Conference or Workshop Item |
語言: | English |
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2025
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主題: | |
在線閱讀: | https://hdl.handle.net/10356/182908 |
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機構: | Nanyang Technological University |
語言: | English |