Oxygen-based microwave induced plasma etching for epoxy molding compound removal in advanced semiconductor devices

Heterogenous integration has led to the development of advanced semiconductor packages with better performance and smaller form factor. Such packages usually comprise of multiple dies and embedded components which are encapsulated with epoxy molding compounds (EMCs) to improve the reliability perfor...

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書目詳細資料
Main Authors: Tan, Hong Siang, Zee, Bernice, Gan, Chee Lip, Kor, Katherine, Tang, Jiaqi, McKinnon, Mark
其他作者: School of Materials Science and Engineering
格式: Conference or Workshop Item
語言:English
出版: 2025
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在線閱讀:https://hdl.handle.net/10356/182908
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機構: Nanyang Technological University
語言: English