Development of nano-mechanical testing sytem for effective assessment of mechanical properties of perpendicular recording magnetic thin films
A magnetic recording disk coated with multilayer thin films is one of the most important components in a hard disk. Failure due to nano-scale scratches on the sputtered thin film layer has imposed a great concern on reliability of hard disk. This is due to the inherent weakness of the perpendicular...
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| 格式: | Theses and Dissertations |
| 語言: | English |
| 出版: |
2009
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| 在線閱讀: | http://hdl.handle.net/10356/18857 |
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| 機構: | Nanyang Technological University |
| 語言: | English |