Development of nano-mechanical testing sytem for effective assessment of mechanical properties of perpendicular recording magnetic thin films

• المؤلف الرئيسي: Zhou, Quan.
• مؤلفون آخرون: Sam Zhang Shanyong
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2009
• الموضوعات: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/18857
• المؤسسة: Nanyang Technological University

A magnetic recording disk coated with multilayer thin films is one of the most important components in a hard disk. Failure due to nano-scale scratches on the sputtered thin film layer has imposed a great concern on reliability of hard disk. This is due to the inherent weakness of the perpendicular...