Integrated testing and algorithms for computer visual inspection of integrated circuits
An automated visual inspection system for Pre-Cap inspection of integrated circuits is presented. This system applys a proposed database-structural-feature technique to inspect wirebond patterns. Four algorithms, one on pre-inspection alignment, one each on inspection of "ball" bonds and &...
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| Main Author: | |
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| Other Authors: | |
| Format: | Theses and Dissertations |
| Language: | English |
| Published: |
2009
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| Online Access: | http://hdl.handle.net/10356/19823 |
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| Institution: | Nanyang Technological University |
| Language: | English |