Integrated testing and algorithms for computer visual inspection of integrated circuits

An automated visual inspection system for Pre-Cap inspection of integrated circuits is presented. This system applys a proposed database-structural-feature technique to inspect wirebond patterns. Four algorithms, one on pre-inspection alignment, one each on inspection of "ball" bonds and &...

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Main Author:	Heng, Aik Swan.
Other Authors:	Lee, Brian Chang Leng
Format:	Theses and Dissertations
Language:	English
Published:	2009
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	http://hdl.handle.net/10356/19823
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Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-19823
record_format	dspace
spelling	sg-ntu-dr.10356-198232023-07-04T16:02:42Z Integrated testing and algorithms for computer visual inspection of integrated circuits Heng, Aik Swan. Lee, Brian Chang Leng School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering An automated visual inspection system for Pre-Cap inspection of integrated circuits is presented. This system applys a proposed database-structural-feature technique to inspect wirebond patterns. Four algorithms, one on pre-inspection alignment, one each on inspection of "ball" bonds and "wedge" bonds, and last on inspection of "crescent" welds, together with results obtained, are discussed. A survey of the various computer visual techniques for integrated circuits is also provided. Master of Engineering 2009-12-14T06:42:15Z 2009-12-14T06:42:15Z 1988 1988 Thesis http://hdl.handle.net/10356/19823 en NANYANG TECHNOLOGICAL UNIVERSITY 215 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering Heng, Aik Swan. Integrated testing and algorithms for computer visual inspection of integrated circuits
description	An automated visual inspection system for Pre-Cap inspection of integrated circuits is presented. This system applys a proposed database-structural-feature technique to inspect wirebond patterns. Four algorithms, one on pre-inspection alignment, one each on inspection of "ball" bonds and "wedge" bonds, and last on inspection of "crescent" welds, together with results obtained, are discussed. A survey of the various computer visual techniques for integrated circuits is also provided.
author2	Lee, Brian Chang Leng
author_facet	Lee, Brian Chang Leng Heng, Aik Swan.
format	Theses and Dissertations
author	Heng, Aik Swan.
author_sort	Heng, Aik Swan.
title	Integrated testing and algorithms for computer visual inspection of integrated circuits
title_short	Integrated testing and algorithms for computer visual inspection of integrated circuits
title_full	Integrated testing and algorithms for computer visual inspection of integrated circuits
title_fullStr	Integrated testing and algorithms for computer visual inspection of integrated circuits
title_full_unstemmed	Integrated testing and algorithms for computer visual inspection of integrated circuits
title_sort	integrated testing and algorithms for computer visual inspection of integrated circuits
publishDate	2009
url	http://hdl.handle.net/10356/19823
_version_	1772826479502032896

Integrated testing and algorithms for computer visual inspection of integrated circuits

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