A diagnostic expert system for automated test equipment A360

• المؤلف الرئيسي: Wong, Sing Ming.
• مؤلفون آخرون: Ho, Hiang Kwee
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2009
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/19861
• المؤسسة: Nanyang Technological University

In the field of semiconductor testing, about three generations of Automated Test Equipment (ATE) were produced over the past twenty years. Most older models have been declared obsolete by the ATE manufacturers, and support is now on a best-effort basis, which means that it is expensive and difficult...