A diagnostic expert system for automated test equipment A360

In the field of semiconductor testing, about three generations of Automated Test Equipment (ATE) were produced over the past twenty years. Most older models have been declared obsolete by the ATE manufacturers, and support is now on a best-effort basis, which means that it is expensive and difficult...

Full description

Saved in:
Bibliographic Details
Main Author: Wong, Sing Ming.
Other Authors: Ho, Hiang Kwee
Format: Theses and Dissertations
Language:English
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/10356/19861
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English

Similar Items