Automated viper 150 low cost basic test station
CONNER Peripherals is a leading supplier of streaming tape drives and disk drives for computing systems. Competition, market volatility and evolving technologies require products that are manufactured to be both reliable and affordable. This paper describes the work involved to design a cost effecti...
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sg-ntu-dr.10356-199942023-03-11T17:25:53Z Automated viper 150 low cost basic test station Chee, Vincent Weng Keong. Lau, Michael Wai Shing School of Mechanical and Production Engineering DRNTU::Engineering::Industrial engineering::Automation CONNER Peripherals is a leading supplier of streaming tape drives and disk drives for computing systems. Competition, market volatility and evolving technologies require products that are manufactured to be both reliable and affordable. This paper describes the work involved to design a cost effective automated test system for an existing model of a tape drive product. It explains the steps needed to design the test system with minimum changes to the current product for testability and the considerations taken to design the cost effective automated test system. Product testability included the modification of existing circuitry, addition of new circuitry and firmware changes that were done such that the product can be tested automatically. Master of Science (Computer Integrated Manufacturing) 2009-12-14T07:55:02Z 2009-12-14T07:55:02Z 1996 1996 Thesis http://hdl.handle.net/10356/19994 en NANYANG TECHNOLOGICAL UNIVERSITY 240 p. application/pdf |
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DRNTU::Engineering::Industrial engineering::Automation Chee, Vincent Weng Keong. Automated viper 150 low cost basic test station |
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CONNER Peripherals is a leading supplier of streaming tape drives and disk drives for computing systems. Competition, market volatility and evolving technologies require products that are manufactured to be both reliable and affordable. This paper describes the work involved to design a cost effective automated test system for an existing model of a tape drive product. It explains the steps needed to design the test system with minimum changes to the current product for testability and the considerations taken to design the cost effective automated test system. Product testability included the modification of existing circuitry, addition of new circuitry and firmware changes that were done such that the product can be tested automatically. |
author2 |
Lau, Michael Wai Shing |
author_facet |
Lau, Michael Wai Shing Chee, Vincent Weng Keong. |
format |
Theses and Dissertations |
author |
Chee, Vincent Weng Keong. |
author_sort |
Chee, Vincent Weng Keong. |
title |
Automated viper 150 low cost basic test station |
title_short |
Automated viper 150 low cost basic test station |
title_full |
Automated viper 150 low cost basic test station |
title_fullStr |
Automated viper 150 low cost basic test station |
title_full_unstemmed |
Automated viper 150 low cost basic test station |
title_sort |
automated viper 150 low cost basic test station |
publishDate |
2009 |
url |
http://hdl.handle.net/10356/19994 |
_version_ |
1761781950278795264 |