Automated viper 150 low cost basic test station

CONNER Peripherals is a leading supplier of streaming tape drives and disk drives for computing systems. Competition, market volatility and evolving technologies require products that are manufactured to be both reliable and affordable. This paper describes the work involved to design a cost effecti...

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Main Author: Chee, Vincent Weng Keong.
Other Authors: Lau, Michael Wai Shing
Format: Theses and Dissertations
Language:English
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/10356/19994
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Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-19994
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spelling sg-ntu-dr.10356-199942023-03-11T17:25:53Z Automated viper 150 low cost basic test station Chee, Vincent Weng Keong. Lau, Michael Wai Shing School of Mechanical and Production Engineering DRNTU::Engineering::Industrial engineering::Automation CONNER Peripherals is a leading supplier of streaming tape drives and disk drives for computing systems. Competition, market volatility and evolving technologies require products that are manufactured to be both reliable and affordable. This paper describes the work involved to design a cost effective automated test system for an existing model of a tape drive product. It explains the steps needed to design the test system with minimum changes to the current product for testability and the considerations taken to design the cost effective automated test system. Product testability included the modification of existing circuitry, addition of new circuitry and firmware changes that were done such that the product can be tested automatically. Master of Science (Computer Integrated Manufacturing) 2009-12-14T07:55:02Z 2009-12-14T07:55:02Z 1996 1996 Thesis http://hdl.handle.net/10356/19994 en NANYANG TECHNOLOGICAL UNIVERSITY 240 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Industrial engineering::Automation
spellingShingle DRNTU::Engineering::Industrial engineering::Automation
Chee, Vincent Weng Keong.
Automated viper 150 low cost basic test station
description CONNER Peripherals is a leading supplier of streaming tape drives and disk drives for computing systems. Competition, market volatility and evolving technologies require products that are manufactured to be both reliable and affordable. This paper describes the work involved to design a cost effective automated test system for an existing model of a tape drive product. It explains the steps needed to design the test system with minimum changes to the current product for testability and the considerations taken to design the cost effective automated test system. Product testability included the modification of existing circuitry, addition of new circuitry and firmware changes that were done such that the product can be tested automatically.
author2 Lau, Michael Wai Shing
author_facet Lau, Michael Wai Shing
Chee, Vincent Weng Keong.
format Theses and Dissertations
author Chee, Vincent Weng Keong.
author_sort Chee, Vincent Weng Keong.
title Automated viper 150 low cost basic test station
title_short Automated viper 150 low cost basic test station
title_full Automated viper 150 low cost basic test station
title_fullStr Automated viper 150 low cost basic test station
title_full_unstemmed Automated viper 150 low cost basic test station
title_sort automated viper 150 low cost basic test station
publishDate 2009
url http://hdl.handle.net/10356/19994
_version_ 1761781950278795264