Economic microcomputer based general purpose in-circuit printed circuit board measurement system

This project investigates an scaled-down measurement system for performing In-circuit testing.

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書目詳細資料
Main Authors: Chin, Edward Hsi Ling, Naik, K. R.
其他作者: School of Electrical and Electronic Engineering
格式: Research Report
出版: 2008
主題:
在線閱讀:http://hdl.handle.net/10356/2954
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