Internal microprobing at VLSI chips

Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing tec...

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Bibliographic Details
Main Authors:	Liu, Po Ching., Chin, Edward Hsi Ling.
Other Authors:	School of Electrical and Electronic Engineering
Format:	Research Report
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Online Access:	http://hdl.handle.net/10356/3032
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-3032
record_format	dspace
spelling	sg-ntu-dr.10356-30322023-03-04T03:24:58Z Internal microprobing at VLSI chips Liu, Po Ching. Chin, Edward Hsi Ling. School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing techniques are presented. RP 33/87 2008-09-17T09:19:14Z 2008-09-17T09:19:14Z 1990 1990 Research Report http://hdl.handle.net/10356/3032 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Liu, Po Ching. Chin, Edward Hsi Ling. Internal microprobing at VLSI chips
description	Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing techniques are presented.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Liu, Po Ching. Chin, Edward Hsi Ling.
format	Research Report
author	Liu, Po Ching. Chin, Edward Hsi Ling.
author_sort	Liu, Po Ching.
title	Internal microprobing at VLSI chips
title_short	Internal microprobing at VLSI chips
title_full	Internal microprobing at VLSI chips
title_fullStr	Internal microprobing at VLSI chips
title_full_unstemmed	Internal microprobing at VLSI chips
title_sort	internal microprobing at vlsi chips
publishDate	2008
url	http://hdl.handle.net/10356/3032
_version_	1759857965633896448

Internal microprobing at VLSI chips

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