Control on yield variations between testers using monitoring-test

In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system.

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Bibliographic Details
Main Author:	Seshadri Raghavendra Murali.
Other Authors:	Wang, Dan Wei
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation
Online Access:	http://hdl.handle.net/10356/3217
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-3217
record_format	dspace
spelling	sg-ntu-dr.10356-32172023-07-04T15:10:11Z Control on yield variations between testers using monitoring-test Seshadri Raghavendra Murali. Wang, Dan Wei School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system. Master of Science (Computer Control and Automation) 2008-09-17T09:24:46Z 2008-09-17T09:24:46Z 2001 2001 Thesis http://hdl.handle.net/10356/3217 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation Seshadri Raghavendra Murali. Control on yield variations between testers using monitoring-test
description	In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system.
author2	Wang, Dan Wei
author_facet	Wang, Dan Wei Seshadri Raghavendra Murali.
format	Theses and Dissertations
author	Seshadri Raghavendra Murali.
author_sort	Seshadri Raghavendra Murali.
title	Control on yield variations between testers using monitoring-test
title_short	Control on yield variations between testers using monitoring-test
title_full	Control on yield variations between testers using monitoring-test
title_fullStr	Control on yield variations between testers using monitoring-test
title_full_unstemmed	Control on yield variations between testers using monitoring-test
title_sort	control on yield variations between testers using monitoring-test
publishDate	2008
url	http://hdl.handle.net/10356/3217
_version_	1772825611799101440

Control on yield variations between testers using monitoring-test

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