An efficient method for parametric yield gradient estimation

• Main Authors: Wu, Ting, Foo, Say Wei
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering
• Online Access: https://hdl.handle.net/10356/91590; http://hdl.handle.net/10220/5850
• Institution: Nanyang Technological University

A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller...