An efficient method for parametric yield gradient estimation

A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller...

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Main Authors:	Wu, Ting, Foo, Say Wei
Other Authors:	School of Electrical and Electronic Engineering
Format:	Conference or Workshop Item
Language:	English
Published:	2009
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering
Online Access:	https://hdl.handle.net/10356/91590 http://hdl.handle.net/10220/5850
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Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-91590
record_format	dspace
spelling	sg-ntu-dr.10356-915902020-03-07T13:24:46Z An efficient method for parametric yield gradient estimation Wu, Ting Foo, Say Wei School of Electrical and Electronic Engineering IEEE International Symposium on Circuits and Systems (1999 : Orlando, Florida, US) DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach. Published version 2009-07-29T08:55:47Z 2019-12-06T18:08:29Z 2009-07-29T08:55:47Z 2019-12-06T18:08:29Z 1999 1999 Conference Paper Wu, T., & Foo, S. W. (1999). An efficient method for parametric yield gradient estimation. In Proceedings of the IEEE International Symposium on Circuits and Systems, (pp. 419-422). Singapore: National University of Singapore. https://hdl.handle.net/10356/91590 http://hdl.handle.net/10220/5850 10.1109/ISCAS.1999.777897 en © IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site 4 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering Wu, Ting Foo, Say Wei An efficient method for parametric yield gradient estimation
description	A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Wu, Ting Foo, Say Wei
format	Conference or Workshop Item
author	Wu, Ting Foo, Say Wei
author_sort	Wu, Ting
title	An efficient method for parametric yield gradient estimation
title_short	An efficient method for parametric yield gradient estimation
title_full	An efficient method for parametric yield gradient estimation
title_fullStr	An efficient method for parametric yield gradient estimation
title_full_unstemmed	An efficient method for parametric yield gradient estimation
title_sort	efficient method for parametric yield gradient estimation
publishDate	2009
url	https://hdl.handle.net/10356/91590 http://hdl.handle.net/10220/5850
_version_	1681035471839297536

An efficient method for parametric yield gradient estimation

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