Design optimization of low noise amplifier with electro-static discharge circuits

This dissertation presents the study of ESD-circuit interaction problems in radio frequency (RF) circuits. Electrostatic discharge (ESD) damage is well known for the current advanced integrated circuit (IC) technologies. A successful on-chip ESD protection circuit design should take a system approac...

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Main Author: Tan, Chee Yuen.
Other Authors: Yeo, Kiat Seng
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3334
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Institution: Nanyang Technological University
id sg-ntu-dr.10356-3334
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spelling sg-ntu-dr.10356-33342023-07-04T15:50:17Z Design optimization of low noise amplifier with electro-static discharge circuits Tan, Chee Yuen. Yeo, Kiat Seng School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits This dissertation presents the study of ESD-circuit interaction problems in radio frequency (RF) circuits. Electrostatic discharge (ESD) damage is well known for the current advanced integrated circuit (IC) technologies. A successful on-chip ESD protection circuit design should take a system approach in order to address the mutual influences between the ESD protection networks and the core circuit being protected. Master of Science (Integrated Circuit Design) 2008-09-17T09:27:40Z 2008-09-17T09:27:40Z 2003 2003 Thesis http://hdl.handle.net/10356/3334 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Tan, Chee Yuen.
Design optimization of low noise amplifier with electro-static discharge circuits
description This dissertation presents the study of ESD-circuit interaction problems in radio frequency (RF) circuits. Electrostatic discharge (ESD) damage is well known for the current advanced integrated circuit (IC) technologies. A successful on-chip ESD protection circuit design should take a system approach in order to address the mutual influences between the ESD protection networks and the core circuit being protected.
author2 Yeo, Kiat Seng
author_facet Yeo, Kiat Seng
Tan, Chee Yuen.
format Theses and Dissertations
author Tan, Chee Yuen.
author_sort Tan, Chee Yuen.
title Design optimization of low noise amplifier with electro-static discharge circuits
title_short Design optimization of low noise amplifier with electro-static discharge circuits
title_full Design optimization of low noise amplifier with electro-static discharge circuits
title_fullStr Design optimization of low noise amplifier with electro-static discharge circuits
title_full_unstemmed Design optimization of low noise amplifier with electro-static discharge circuits
title_sort design optimization of low noise amplifier with electro-static discharge circuits
publishDate 2008
url http://hdl.handle.net/10356/3334
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