RF testing of QPSK device

• المؤلف الرئيسي: Chan, Siew Meng.
• مؤلفون آخرون: Karmakar, Nemai Chandra
• التنسيق: Theses and Dissertations
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/3338
• المؤسسة: Nanyang Technological University

The concepts of RF testing of a QPSK device are introduced and followed by the presentation of the simulation results of a common RF tests involving a Quadrature Phase Shift Keying (QPSK) modulator and demodulator.