0.18 um DRAM product electrical failure analysis for prediction of physical defects

Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM).

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Bibliographic Details
Main Author:	Tej Bahadur Megh Raj.
Other Authors:	Krishnamachar Prasad
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Power electronics
Online Access:	http://hdl.handle.net/10356/3543
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-3543
record_format	dspace
spelling	sg-ntu-dr.10356-35432023-07-04T15:51:31Z 0.18 um DRAM product electrical failure analysis for prediction of physical defects Tej Bahadur Megh Raj. Krishnamachar Prasad School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Power electronics Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM). Master of Science (Microelectronics) 2008-09-17T09:31:59Z 2008-09-17T09:31:59Z 2004 2004 Thesis http://hdl.handle.net/10356/3543 Nanyang Technological University 131 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Power electronics
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Power electronics Tej Bahadur Megh Raj. 0.18 um DRAM product electrical failure analysis for prediction of physical defects
description	Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM).
author2	Krishnamachar Prasad
author_facet	Krishnamachar Prasad Tej Bahadur Megh Raj.
format	Theses and Dissertations
author	Tej Bahadur Megh Raj.
author_sort	Tej Bahadur Megh Raj.
title	0.18 um DRAM product electrical failure analysis for prediction of physical defects
title_short	0.18 um DRAM product electrical failure analysis for prediction of physical defects
title_full	0.18 um DRAM product electrical failure analysis for prediction of physical defects
title_fullStr	0.18 um DRAM product electrical failure analysis for prediction of physical defects
title_full_unstemmed	0.18 um DRAM product electrical failure analysis for prediction of physical defects
title_sort	0.18 um dram product electrical failure analysis for prediction of physical defects
publishDate	2008
url	http://hdl.handle.net/10356/3543
_version_	1772827601231937536

0.18 um DRAM product electrical failure analysis for prediction of physical defects

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