0.18 um DRAM product electrical failure analysis for prediction of physical defects

• Main Author: Tej Bahadur Megh Raj.
• Other Authors: Krishnamachar Prasad
• Format: Theses and Dissertations
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Power electronics
• Online Access: http://hdl.handle.net/10356/3543
• Institution: Nanyang Technological University

Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM).