Automated visual inspection of IC packages

Automated visual inspection of IC packages

This dissertation focuses on some issues on the automatic inspection of IC packages and presents computer vision based techniques that were developed to perform automatic IC print mark inspection, automatic IC leads inspections, and inspection of the batch numbers on IC packages using the OCR system...

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Main Author: U Maung Maung Thet
Other Authors: Teoh, Eam Khwang
Format: Theses and Dissertations
Published: 2008
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
Online Access:http://hdl.handle.net/10356/3616
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Institution: Nanyang Technological University
id sg-ntu-dr.10356-3616
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spelling sg-ntu-dr.10356-36162023-07-04T15:10:39Z Automated visual inspection of IC packages U Maung Maung Thet Teoh, Eam Khwang School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging This dissertation focuses on some issues on the automatic inspection of IC packages and presents computer vision based techniques that were developed to perform automatic IC print mark inspection, automatic IC leads inspections, and inspection of the batch numbers on IC packages using the OCR system. Master of Science (Computer Control and Automation) 2008-09-17T09:33:44Z 2008-09-17T09:33:44Z 2002 2002 Thesis http://hdl.handle.net/10356/3616 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
U Maung Maung Thet
Automated visual inspection of IC packages
description This dissertation focuses on some issues on the automatic inspection of IC packages and presents computer vision based techniques that were developed to perform automatic IC print mark inspection, automatic IC leads inspections, and inspection of the batch numbers on IC packages using the OCR system.
author2 Teoh, Eam Khwang
author_facet Teoh, Eam Khwang
U Maung Maung Thet
format Theses and Dissertations
author U Maung Maung Thet
author_sort U Maung Maung Thet
title Automated visual inspection of IC packages
title_short Automated visual inspection of IC packages
title_full Automated visual inspection of IC packages
title_fullStr Automated visual inspection of IC packages
title_full_unstemmed Automated visual inspection of IC packages
title_sort automated visual inspection of ic packages
publishDate 2008
url http://hdl.handle.net/10356/3616
_version_ 1772825496133828608

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