Predictive technology modeling for deep-submicron MOSFET design

The predictive technology modeling using numerical and compact model for deep-submicron MOSFET is explored in this thesis. The devices are designed for a broad range of nMOSFETs with different pile-up/different LDD extension under gate structures. The investigations inludes numerical modeling for th...

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Bibliographic Details
Main Author: Wang, Yuwen.
Other Authors: Zhou, Xing
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3709
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Institution: Nanyang Technological University
Description
Summary:The predictive technology modeling using numerical and compact model for deep-submicron MOSFET is explored in this thesis. The devices are designed for a broad range of nMOSFETs with different pile-up/different LDD extension under gate structures. The investigations inludes numerical modeling for threshold voltage, with different pile-up structure MOSFETs.