Technology prediction with semi-empirical compact modeling approach

The aim of this project is to explore the prediction of new CMOS technology parameters with the aid of a semi-empirical compact model that has been calibrated to the given technology. The compact model parameters will be extracted from a given technology data and, whenever possible, correlated to pr...

Full description

Saved in:
Bibliographic Details
Main Author: Tan, William.
Other Authors: Zhou, Xing
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3732
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
id sg-ntu-dr.10356-3732
record_format dspace
spelling sg-ntu-dr.10356-37322023-07-04T15:01:10Z Technology prediction with semi-empirical compact modeling approach Tan, William. Zhou, Xing School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems The aim of this project is to explore the prediction of new CMOS technology parameters with the aid of a semi-empirical compact model that has been calibrated to the given technology. The compact model parameters will be extracted from a given technology data and, whenever possible, correlated to process parameters. Extrapolation to scaled devices will be studied for optimizing the performance with variation of major process parameters. Master of Science (Microelectronics) 2008-09-17T09:36:17Z 2008-09-17T09:36:17Z 2003 2003 Thesis http://hdl.handle.net/10356/3732 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
Tan, William.
Technology prediction with semi-empirical compact modeling approach
description The aim of this project is to explore the prediction of new CMOS technology parameters with the aid of a semi-empirical compact model that has been calibrated to the given technology. The compact model parameters will be extracted from a given technology data and, whenever possible, correlated to process parameters. Extrapolation to scaled devices will be studied for optimizing the performance with variation of major process parameters.
author2 Zhou, Xing
author_facet Zhou, Xing
Tan, William.
format Theses and Dissertations
author Tan, William.
author_sort Tan, William.
title Technology prediction with semi-empirical compact modeling approach
title_short Technology prediction with semi-empirical compact modeling approach
title_full Technology prediction with semi-empirical compact modeling approach
title_fullStr Technology prediction with semi-empirical compact modeling approach
title_full_unstemmed Technology prediction with semi-empirical compact modeling approach
title_sort technology prediction with semi-empirical compact modeling approach
publishDate 2008
url http://hdl.handle.net/10356/3732
_version_ 1772828043430068224