Technology prediction with semi-empirical compact modeling approach

The aim of this project is to explore the prediction of new CMOS technology parameters with the aid of a semi-empirical compact model that has been calibrated to the given technology. The compact model parameters will be extracted from a given technology data and, whenever possible, correlated to pr...

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Bibliographic Details
Main Author: Tan, William.
Other Authors: Zhou, Xing
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3732
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Institution: Nanyang Technological University

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