Flicker noise fluctuations in deep submicron MOSFETs

166 p.

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Bibliographic Details
Main Author:	Chew, Johnny Kok Wai
Other Authors:	Yeo Kiat Seng
Format:	Theses and Dissertations
Published:	2010
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Online Access:	https://hdl.handle.net/10356/39154
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Institution:	Nanyang Technological University

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spelling	sg-ntu-dr.10356-391542023-07-04T17:04:44Z Flicker noise fluctuations in deep submicron MOSFETs Chew, Johnny Kok Wai Yeo Kiat Seng School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Semiconductors 166 p. This thesis investigates the effects of technology scaling on the flicker (or \lf) noise performance of deep submicron complementary metal-oxide-semiconductor (CMOS) transistors. Two major effects have been investigated, namely the employment of different gate dielectric growth and subsequent nitridation conditions, and the effects of geometry scaling. The first part of this work focus on the study of these two effects within the 0.25p.m technology node. Subsequently the scope of this study has been widened to examine the effects of scaling across a spectrum of technology nodes, namely 0.35um, 0.25um, 0.18pm and 0.13um. Finally the scope is further extended to cover the offering of different process flavours, as well as geometry scaling for the 0.13pm technology node. DOCTOR OF PHILOSOPHY (EEE) 2010-05-21T04:46:16Z 2010-05-21T04:46:16Z 2007 2007 Thesis Chew, J. K. W. (2007). Flicker noise fluctuations in deep submicron MOSFETs. Doctoral thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/39154 10.32657/10356/39154 application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors Chew, Johnny Kok Wai Flicker noise fluctuations in deep submicron MOSFETs
description	166 p.
author2	Yeo Kiat Seng
author_facet	Yeo Kiat Seng Chew, Johnny Kok Wai
format	Theses and Dissertations
author	Chew, Johnny Kok Wai
author_sort	Chew, Johnny Kok Wai
title	Flicker noise fluctuations in deep submicron MOSFETs
title_short	Flicker noise fluctuations in deep submicron MOSFETs
title_full	Flicker noise fluctuations in deep submicron MOSFETs
title_fullStr	Flicker noise fluctuations in deep submicron MOSFETs
title_full_unstemmed	Flicker noise fluctuations in deep submicron MOSFETs
title_sort	flicker noise fluctuations in deep submicron mosfets
publishDate	2010
url	https://hdl.handle.net/10356/39154
_version_	1772827948521357312

Flicker noise fluctuations in deep submicron MOSFETs

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