Flicker noise fluctuations in deep submicron MOSFETs

166 p.

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Bibliographic Details
Main Author: Chew, Johnny Kok Wai
Other Authors: Yeo Kiat Seng
Format: Theses and Dissertations
Published: 2010
Subjects:
Online Access:https://hdl.handle.net/10356/39154
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Institution: Nanyang Technological University

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