Enabling scanning moire phase shifting interferometry in image processing

• المؤلف الرئيسي: Chin, Chee Hwa.
• مؤلفون آخرون: Wen, Changyun
• التنسيق: Theses and Dissertations
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/4140

A method for on-the-fly 3-D surface profilometry using scanning moire phase shifting interferometry is proposed. The proposed optical setup allows on-the-fly phase shifting analysis without phase shifting mechanism.