Enabling scanning moire phase shifting interferometry in image processing

• Main Author: Chin, Chee Hwa.
• Other Authors: Wen, Changyun
• Format: Theses and Dissertations
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems
• Online Access: http://hdl.handle.net/10356/4140
• Institution: Nanyang Technological University

A method for on-the-fly 3-D surface profilometry using scanning moire phase shifting interferometry is proposed. The proposed optical setup allows on-the-fly phase shifting analysis without phase shifting mechanism.