Silicon nanowire characterization for fatigue and reliability

• 主要作者: Yim, Wai Tat.
• 其他作者: School of Mechanical and Aerospace Engineering
• 格式: Final Year Project
• 語言: English
• 出版: 2011
• 主題: DRNTU::Engineering::Materials::Material testing and characterization
• 在線閱讀: http://hdl.handle.net/10356/44973
• 機構: Nanyang Technological University

This final year project report mainly focus on a project that is in conjunction with A*STAR Institute of Microelectronics in performing a study on the silicon nanowire characterization for fatigue and reliability. The project encompass a background research on relevant mechanical and reliability...