Silicon nanowire characterization for fatigue and reliability

• Main Author: Yim, Wai Tat.
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Final Year Project
• Language: English
• Published: 2011
• Subjects: DRNTU::Engineering::Materials::Material testing and characterization
• Online Access: http://hdl.handle.net/10356/44973
• Institution: Nanyang Technological University

This final year project report mainly focus on a project that is in conjunction with A*STAR Institute of Microelectronics in performing a study on the silicon nanowire characterization for fatigue and reliability. The project encompass a background research on relevant mechanical and reliability...