Silicon nanowire characterization for fatigue and reliability

• المؤلف الرئيسي: Yim, Wai Tat.
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2011
• الموضوعات: DRNTU::Engineering::Materials::Material testing and characterization
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/44973

This final year project report mainly focus on a project that is in conjunction with A*STAR Institute of Microelectronics in performing a study on the silicon nanowire characterization for fatigue and reliability. The project encompass a background research on relevant mechanical and reliability...