Noise measurement circuit for avalanche photo diode
101 p.
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sg-ntu-dr.10356-468652023-07-04T16:03:41Z Noise measurement circuit for avalanche photo diode Lim, Alvin Tong Wen. Goh Wang Ling ; Ng Beng Koon School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering 101 p. Avalanche photodiodes (APD) are photodetectors which have higher internal gain compared to the other photodiodes. This is due to impact ionization therefore more sensitive compared to other semiconductor. The project concentrates on the noise measurement circuit for the APD. Master of Science (Consumer Electronics) 2011-12-23T10:02:19Z 2011-12-23T10:02:19Z 2011 Thesis http://hdl.handle.net/10356/46865 Nanyang Technological University application/pdf |
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DRNTU::Engineering::Electrical and electronic engineering Lim, Alvin Tong Wen. Noise measurement circuit for avalanche photo diode |
description |
101 p. |
author2 |
Goh Wang Ling ; Ng Beng Koon |
author_facet |
Goh Wang Ling ; Ng Beng Koon Lim, Alvin Tong Wen. |
format |
Theses and Dissertations |
author |
Lim, Alvin Tong Wen. |
author_sort |
Lim, Alvin Tong Wen. |
title |
Noise measurement circuit for avalanche photo diode |
title_short |
Noise measurement circuit for avalanche photo diode |
title_full |
Noise measurement circuit for avalanche photo diode |
title_fullStr |
Noise measurement circuit for avalanche photo diode |
title_full_unstemmed |
Noise measurement circuit for avalanche photo diode |
title_sort |
noise measurement circuit for avalanche photo diode |
publishDate |
2011 |
url |
http://hdl.handle.net/10356/46865 |
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1772827294446911488 |