Noise measurement circuit for avalanche photo diode

101 p.

Saved in:
Bibliographic Details
Main Author: Lim, Alvin Tong Wen.
Other Authors: Goh Wang Ling ; Ng Beng Koon
Format: Theses and Dissertations
Published: 2011
Subjects:
Online Access:http://hdl.handle.net/10356/46865
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
id sg-ntu-dr.10356-46865
record_format dspace
spelling sg-ntu-dr.10356-468652023-07-04T16:03:41Z Noise measurement circuit for avalanche photo diode Lim, Alvin Tong Wen. Goh Wang Ling ; Ng Beng Koon School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering 101 p. Avalanche photodiodes (APD) are photodetectors which have higher internal gain compared to the other photodiodes. This is due to impact ionization therefore more sensitive compared to other semiconductor. The project concentrates on the noise measurement circuit for the APD. Master of Science (Consumer Electronics) 2011-12-23T10:02:19Z 2011-12-23T10:02:19Z 2011 Thesis http://hdl.handle.net/10356/46865 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Lim, Alvin Tong Wen.
Noise measurement circuit for avalanche photo diode
description 101 p.
author2 Goh Wang Ling ; Ng Beng Koon
author_facet Goh Wang Ling ; Ng Beng Koon
Lim, Alvin Tong Wen.
format Theses and Dissertations
author Lim, Alvin Tong Wen.
author_sort Lim, Alvin Tong Wen.
title Noise measurement circuit for avalanche photo diode
title_short Noise measurement circuit for avalanche photo diode
title_full Noise measurement circuit for avalanche photo diode
title_fullStr Noise measurement circuit for avalanche photo diode
title_full_unstemmed Noise measurement circuit for avalanche photo diode
title_sort noise measurement circuit for avalanche photo diode
publishDate 2011
url http://hdl.handle.net/10356/46865
_version_ 1772827294446911488