Investigation of the avalanche multiplication characteristics in advanced avalanche photodiodes (APDs)

Advanced semiconductor technology has enabled APDs with narrow multiplication widths, but such application has been limited due to poor performance predicted by the McIntyre’s expression, which is based on the local assumption that ignores the dead space effects of the impact ionization process. Usi...

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書目詳細資料
主要作者: Toh, Rui Tze.
其他作者: Ng Beng Koon
格式: Final Year Project
語言:English
出版: 2012
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在線閱讀:http://hdl.handle.net/10356/49936
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機構: Nanyang Technological University
語言: English