Investigation of the avalanche multiplication characteristics in advanced avalanche photodiodes (APDs)

Advanced semiconductor technology has enabled APDs with narrow multiplication widths, but such application has been limited due to poor performance predicted by the McIntyre’s expression, which is based on the local assumption that ignores the dead space effects of the impact ionization process. Usi...

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Bibliographic Details
Main Author: Toh, Rui Tze.
Other Authors: Ng Beng Koon
Format: Final Year Project
Language:English
Published: 2012
Subjects:
Online Access:http://hdl.handle.net/10356/49936
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Institution: Nanyang Technological University
Language: English

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