Development of IC test platform for DSP integrated circuit applications

This project is to develop a test platform for implementation of DSP chip functional and timing measurements.

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Bibliographic Details
Main Author: Nagarajan Cheliyan
Other Authors: Charoensak, Charayaphan
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/4921
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-49212023-07-04T15:19:16Z Development of IC test platform for DSP integrated circuit applications Nagarajan Cheliyan Charoensak, Charayaphan School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits This project is to develop a test platform for implementation of DSP chip functional and timing measurements. Master of Science (Signal Processing) 2008-09-17T10:01:29Z 2008-09-17T10:01:29Z 2002 2002 Thesis http://hdl.handle.net/10356/4921 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Nagarajan Cheliyan
Development of IC test platform for DSP integrated circuit applications
description This project is to develop a test platform for implementation of DSP chip functional and timing measurements.
author2 Charoensak, Charayaphan
author_facet Charoensak, Charayaphan
Nagarajan Cheliyan
format Theses and Dissertations
author Nagarajan Cheliyan
author_sort Nagarajan Cheliyan
title Development of IC test platform for DSP integrated circuit applications
title_short Development of IC test platform for DSP integrated circuit applications
title_full Development of IC test platform for DSP integrated circuit applications
title_fullStr Development of IC test platform for DSP integrated circuit applications
title_full_unstemmed Development of IC test platform for DSP integrated circuit applications
title_sort development of ic test platform for dsp integrated circuit applications
publishDate 2008
url http://hdl.handle.net/10356/4921
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