Development of IC test platform for DSP integrated circuit applications
This project is to develop a test platform for implementation of DSP chip functional and timing measurements.
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| 格式: | Theses and Dissertations |
| 出版: |
2008
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| 主題: | |
| 在線閱讀: | http://hdl.handle.net/10356/4921 |
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| 機構: | Nanyang Technological University |