Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters

This project is carried out with the main purpose of improving line-width uniformity and deviation across each wafer through optimization of the photolithography processes. In order to remain price competitive in the chip market, this project is also aimed at reducing production costs.

Saved in:
Bibliographic Details
Main Author: Ong, Eunice Ho Hui.
Other Authors: Zhu, Weiguang
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/4999
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
id sg-ntu-dr.10356-4999
record_format dspace
spelling sg-ntu-dr.10356-49992023-07-04T16:38:49Z Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters Ong, Eunice Ho Hui. Zhu, Weiguang School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging This project is carried out with the main purpose of improving line-width uniformity and deviation across each wafer through optimization of the photolithography processes. In order to remain price competitive in the chip market, this project is also aimed at reducing production costs. Master of Science (Microelectronics) 2008-09-17T10:02:59Z 2008-09-17T10:02:59Z 2005 2005 Thesis http://hdl.handle.net/10356/4999 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
Ong, Eunice Ho Hui.
Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters
description This project is carried out with the main purpose of improving line-width uniformity and deviation across each wafer through optimization of the photolithography processes. In order to remain price competitive in the chip market, this project is also aimed at reducing production costs.
author2 Zhu, Weiguang
author_facet Zhu, Weiguang
Ong, Eunice Ho Hui.
format Theses and Dissertations
author Ong, Eunice Ho Hui.
author_sort Ong, Eunice Ho Hui.
title Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters
title_short Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters
title_full Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters
title_fullStr Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters
title_full_unstemmed Improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters
title_sort improvement on the uniformity and deviation of structured patterns for surface acoustic wave filters
publishDate 2008
url http://hdl.handle.net/10356/4999
_version_ 1772825794130739200