New control charts for monitoring frequency and magnitude of critical events

• Main Author: Qu, Liang.
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Theses and Dissertations
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Industrial engineering
• Online Access: http://hdl.handle.net/10356/51341
• Institution: Nanyang Technological University

Quality is an extremely important feature for satisfying customers and winning market shares nowadays. When a quality problem occurs, it is crucial to detect it quickly in order to avoid serious consequence and economic loss. A very effective method in Statistical Process Control (SPC) is control ch...