Process methodology for semiconductor parametric extraction and analysis

• Main Author: Lim, Shihui.
• Other Authors: Yoon Soon Fatt
• Format: Final Year Project
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• Online Access: http://hdl.handle.net/10356/53402
• Institution: Nanyang Technological University

The purpose of this report is to provide a summary of the Final Year Project (FYP) that is done together with a researcher. In this report, the characterization of the laser etch facet during fabrication, characterization of the laser performance and creation of the light intensity measurement LabVI...